Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Measurement
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Material Processing
Mechanical Testing
Inspection and failure Analysis
Particle Size Analyzer BLUEWAVE S3500
Model:
S3500
Status:
Operational
Location:
4230
Description:
Tri–laser, blue / red, multi-detector, Algorithms that utilize Mie compensation and Modified Mie calculations for spherical and non-spherical materials, Measurement capability from 0.01 to 2,800 µm; Wet and dry measurements
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