Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Surface analysis Kratos Axis Ultra
Model:
Axis Ultra DLD
Status:
Operational
Location:
2211
Description:
Kratos Axis Ultra DLD multi-technique surface analysis system: imaging XPS, AES and UPS.
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