Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Metallurgical Microscope and Image Analysis System Q500
Model:
Q500 (Leica)
Status:
Disposed
Location:
1125
Description:
Metallurgical Microscope,Model BH2-MJLT (Olympus),reflected/transmitted mode, auto-photo controller, polarizer and analyzers; Image Analysis System, Model Q500 (Leica),General purpose image processor
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