Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Wire Saw
Model:
810/S (South Bay Technology)
Status:
Disposed
Location:
2151
Description:
Wire Saw, Model 810/S (South Bay Technology)
© The Hong Kong University of Science and Technology. All rights reserved. Privacy Policy