Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Thermal conductivity_Discovery
Model:
EM-500
Status:
Operational
Location:
2152
Description:
Patented High-Speed Xenon-pulse Delivery™ source (HSXD) and an anamorphic multi-faceted Light Pipe. Testing samples up to a diameter of 25.4 mm over a temperature range from ambient to 500°C.
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