Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Renishaw inVia Qontor Spectrometer System
Model:
inVia Qontor (Renishaw Ltd.)
Status:
Operational
Location:
2153
Description:
Renishaw inVia Qontor Spectrometer System for Raman spectral analysis using visible excitation at 325nm, 532nm, 633nm, 785nm & 1064nm, featuring full automation and 'LiveTrack' real time sample focusing system
Remark:
325nm, 532nm,633nm,785nm, 1064nm
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