Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
AJA ORION 8 -Sputtering System  
Model:
AJA ORION 8 (AJA International)
Status:
Maintenance
Location:
2151B
Description:
Sputter Sources: Seven 2” confocal magnetron sputter sources and one direct deposition source.Argon (Ar), Oxygen (O2), Nitrogen (N2) Metal targets: Au, Pt, Nb, Ta, Fe, Ni and etcDielectric targets: TaN, TiW, TiN, SiO2, Si3N4, Al2O3, ITO.
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