Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Sputtering system-Explorer
Model:
Explorer 14 (Denton Vacuum)
Status:
Maintenance
Location:
2220
Description:
Thin Film Sputtering System (Denton Vacuum), model Explorer 14, 2 magnetron sputtering sources, DC and RF sputtering
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