Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Powder X-ray diffractometer_PANalytical
Model:
X'pert Pro (PANalytical)
Status:
Operational
Location:
2150
Description:
PAnalytical X-ray Diffractometer, Model X'pert Pro. Applications:Structure determination, phase identification, determination of crystallinity and grain / particle size, and thin film thickness and phase analysis.
Remark:
High temperature experiment not available
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