Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Scanning Probe Microscope_Dimension ICON
Model:
Dimension ICON (Bruker)
Status:
Partially Operational
Location:
2153
Description:
Bruker PT Scanning Probe Microscope – Dimension ICON, NanoMechanics Lab – AFM – nDMA Accessory, NanoScope PeakForce QNM High Accuracy Software Option, PeakForce TUNA Application Module and PeakForce KPFM Package
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