Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Talos F200X G2 S/TEM
Model:
Talos F200X G2 TEM (ThermoFisher Scientific)
Status:
Operational
Location:
2220
Description:
200 kV FEG S/TEM for HR STEM and TEM imaging;TEM point resolution/information limit: 0.25 nm/ 0.12 nm, STEM resolution: 0.16 nm; Super-X four SDDs EDS detector system for fast EDS spectroscopy and mapping;
© The Hong Kong University of Science and Technology. All rights reserved. Privacy Policy