Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
JSM-IT800 SHL SEM
Model:
JSM-IT800(SHL) (JEOL)
Status:
Operational
Location:
1125
Description:
Remark:
If user is 15 mins late, session will be assigned to other user. New user is not allowed to book 12:00–14:00, this is reserved only for users with more than 6 recorded equip. uses. User may book only 1 time @ week & must be canceled at least 24 hrs before.
Link:
https://www.jeol.com/products/scientific/sem/JSM-IT800.php
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