Aberration Corrected TEM
Description:
JEM-ARM200F TEM with probe corrector and cold field emission gun. STEM-HAADF resolution: 83 pm; Selectable HT: 200kV, 80kV, 60kV and 30kV; EDS with dual SDD detectors; GATAN Enfinium EELS spectrometer with dual EELS capabilities; Tomography