Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
JEOL-6390 SEM
Model:
JSM-6390 (JEOL)
Status:
Operational
Location:
1125
Description:
General purpose scanning electron miscrope with SE, BSE detectors
Remark:
If user is 15 mins late, session will be assigned to other user. New user is not allowed to book 12:00–14:00, this is reserved only for users with more than 6 recorded equip. uses. User may book only 1 time @ week & must be canceled at least 24 hrs before.
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