Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
JEOL-6390 SEM
Model:
JSM-6390 (JEOL)
Status:
Operational
Location:
1125
Description:
General purpose scanning electron miscrope with SE, BSE detectors
Remark:
Remark: If user is 15 mins late, the session will be assigned to other users . ** NEW USER IS NOT ALLOWED TO BOOK THE NOON SESSION (12:00-14:00), but only for user with more than six recorded equipment uses.** ALL USER CAN ONLY BOOK ONE SESSION per week
© The Hong Kong University of Science and Technology. All rights reserved. Privacy Policy