Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
JEOL-6390 SEM
Model:
JSM-6390 (JEOL)
Status:
Operational
Location:
1125
Description:
General purpose scanning electron miscrope with SE, BSE detectors
Remark:
If user is 15 mins late, the session will be TAKEN OVER by other users. ** NEW USER CAN NOT BOOK 12:00 TO 14:00 SESSION!** ALL USER CAN ONLY BOOK One SESSION per week.
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