Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
JEOL-6700F SEM
Model:
JSM-6700F
Status:
Operational
Location:
1125
Description:
Ultra-high resolution Scanning Electron Microscope (1 nm at 15 kV and 2.2 nm at 1 kV), Cold field emission gun, Model JSM-6700F
Remark:
If user is 15 mins late, the session will be assigned to other users ALL USER CAN ONLY BOOK One SESSION per week
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