Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
JEOL 2010F TEM
Model:
JEM 2010F (JEOL)
Status:
Operational
Location:
2214
Description:
Analytical Transmission Electron Microscope (TEM), Lattice resolution = 0.102 nm, Field Emission Gun, EDS, Electron Energy Loss Spectrometer (EELS), MSC CCD Camera
Remark:
Max two sessions (3 hrs) per week. Excess booking will be cancelled.
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