Nuclear Magnetic Resonance
JEOL 2010 TEM
Model:
JEM 2010 (JEOL)
Status:
Under Repair
Location:
2218
Description:
Transmission Electron Microscope (TEM), Lattice resolution = 0.19nm, Multi-Scan CCD Camera with EDS mapping system and using 65mm^2 Oxford Silicon Drift Detector (SDD)– X-Max with resolution better than 133eV.
Remark:
Max 1 session per week, only displayed week 1 can be booked