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Surface Science
Surface Analysis Kratos Axis Supra+
Surface analysis Kratos Axis Ultra
TOF SIMS V
TOF-SIMS M6
Scanning Probe Microscopy
Scanning Probe Microscope_Dimension NEXUS
Scanning Probe Microscope_Dimension ICON
X-Ray Diffraction
Multi-purpose XRD
Panalytical Empyrean MultiCore PIX3D
Powder X-ray diffractometer_PANalytical
Nuclear Magnetic Resonance
Varian NMR spectrometer
Thin Film
AJA ORION 8 -Sputtering System
Evaporation system - Explorer 14
KLA-Tencor Alpha-Step Stylus Profiler
Sputtering system-Explorer
Thin Film Sputtering System-Denton
Optical Characterisation
Bruker FTIR
Ellipsometer_Woollam
MicroRaman/Photoluminescence System
Near-field Imaging/Spectroscopy
Renishaw inVia Qontor Spectrometer System
UV-VIS-NIR Spectrophotometer
Electrical/Magnetic Characterisation
Cryostat
Electrochemical Analyzer
Hall effect measurement system
Thermal Analysis
Discovery DSC 2500
DSC TA Q1000
Simultaneous Thermal Analyzer (STA)
TGA Q5000
TGA-5500
TGA/DTA Setaram
Thermal conductivity_Discovery
Sample Preparation-General
Band Saw_Allied
Centorr High Temp Vacuum Furnace
Diamond Saw1_4
Diamond Wheel Saw 4' II
Electric Balance
Glass Maker
Hand Polishing Equipment
High Speed Digital Camera
High Temperature Furnace
High Temperature Furnance II
Image Analysis System Q600
Mechanical Polish/Lapping Equipment III
Metallurgical Microscope and Image Analysis System Q500
Microhardness Tester
Olympus Optical Microscopy
Polisher1_8
Precision wire saw
Rotary Microtome
Sample mounting
Sieve shaker
Sliding Microtome
Vacuum oven
Wire Saw
Sample Preparation-Electron_Microscopy
Abrasive Slurry Disc Cutter
Carbon Coater
Cooling Cross Section Polisher
Dimpler grinder
Fischione Ion Miller
Gold Sputter Coater
Ion Beam Miller 691
Platinum Sputter Coater_Quorum
Ultrasonic Disk Cutter
Element Analysis
X-ray fluorescence spectrometer (XRF)
Nano Fabrication
Desktop sputtering system
Dual Beam FIB/SEM
E-beam Evaporation System-Peva
E-beam for metal
E-beam for oxide
e-LiNE
Focused Ion Beam (II)
Optical microscope
Oven
Physical Property Measurement System
Plasma cleaner
RIE-ICP Etcher
Spin Coater and Hot Plate
UV Direct Writer
Wedge bonder (AB520)
Wedge bonder (AB550)
Liquid Helium Plant
Helial Liquefaction System
Helium Liquefier System
Scanning Electron Microscopy-SEM
Environmental SEM
JEOL-6390 SEM
JEOL-6700F SEM
JEOL-7100F SEM
JEOL-7800F SEM
JSM-IT800 SHL SEM
Transmission Electron Microscopy-TEM
Aberration Corrected TEM
JEOL 2010F TEM
Talos F200X G2 S/TEM
TOF-SIMS M6
Model:
TOF-SIMS M6 (IONTOF GmbH)
Status:
Operational
Location:
2219
Description:
Time-of-flight Secondary Ion Mass Spectrometer, TOF-SIMS M6 (IONTOF GmbH); Equipped with pulsed Bi cluster (Bi+, Bi3+, Bi3++), Ar cluster, Cs and O2 dual ion sources.
Link:
https://www.iontof.com/m6-tof-sims-technology-mass-resolution-secondary-ion-mass-spectrometry.html
Technology:
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS)
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