Nuclear Magnetic Resonance
TOF SIMS V
Model:
TOF SIMS V (ION-TOF GmbH)
Status:
Under Repair
Location:
2219
Description:
Time-of-flight Secondary Ion Mass Spectrometer, ToF SIMS V (ION-TOF GmbH); Equipped with Bi cluster (Bi+, Bi3+, Bi3++ etc), C60 and Cs primary ion sources.