Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
TOF SIMS V
Model:
TOF SIMS V (ION-TOF GmbH)
Status:
Under Repair
Location:
2219
Description:
Time-of-flight Secondary Ion Mass Spectrometer, ToF SIMS V (ION-TOF GmbH); Equipped with Bi cluster (Bi+, Bi3+, Bi3++ etc), C60 and Cs primary ion sources.
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