Electron Microscopy


   

A major technological advance of the 20th century has been the invention of electron microscopes. These instruments have revolutionized our knowledge about the materials world. Electron Microscopy is a powerful technique, which has increased our knowledge and helped us to design new modern materials which today give us modern transportation, communication and consumer products. Within the electron microscope family there are two main varieties, the scanning and the transmission microscope. The scanning electron microscope enables us to see surface detail and structure, whereas the transmission electron microscope allows us to see inside materials revealing the hidden structure and components that make up that material. Electron microscopy has many diverse applications, however the main areas of use are material, physics, chemistry, biology, and medical sciences.

MCPF has a total six microscopes, each with a specific purpose. A dedicated high-resolution transmission electron microscope enables us to see interfaces and structures at the atomic level, while an analytical transmission electron microscope gives us structure and chemical information down to a few nanometers. Our scanning microscopes provide crystallographic, topography and composition information from the surface of the material, from a few 10ís of nanometers to the macro scale. The microscopes are supported by a wide selection of specialized sample preparation equipment.

Electron Microscope Instrumentation

  High Resolution Transmission Electron Microscope
  Analytical Transmission Electron Microscope, with energy dispersive x-ray micro-analysis
  General Purpose Transmission Electron Microscope
  High Resolution Scanning Electron Microscope
  Analytical Scanning Electron Microscope
  General Purpose Scanning Electron Microscope

Information Provide by Electron Microscopy

  Quantitative elemental analysis
  Micro-area analysis
  Elemental mapping
  Surface topography and structural information
  Crystallographic information
  Defect imaging
  Phase identification

Typical Applications

  Semiconductors, ceramics, polymers, biological and composite materials
  Phase and structure determination
  Observation of phase changes
  Imaging semiconductor devices and thin film transistors 
  Materials solutions such as fracture analysis of composite materials
  Defect and failure analysis
  Thin film thickness and composition analysis
  Catalysts for environmental solutions such as environmental catalysts
  Texture analysis
  Particle and Contamination analysis
Dynamic experiments such as stress measurements as a function of temperature